JEOL 2100 High Resolution Transmission Electron Microscope (HR TEM)

  • Bright Field Imaging
  • Dark Field Imaging
  • SAED Imaging (Selected Area Electron Diffraction)
  • EDX Imaging (Energy Dispersive X-ray)
  • STEM Imaging (Scanning Transmission Electron Microscopy)
  • Double Tilt Grid Holder for Tomography Analyses
  • Cryo-Prep Grid Holder for Cryo-TEM
  • Gatan Imaging Software
  • Oxford INCA EDX Analysis Software
  • Located at the Westville campus unit

Zeiss Ultra Plus Field Emission Gun Scanning Electron Microscope (FEG SEM)

  • Bright Field Imaging
  • Backscattered Electron Imaging
  • EDX Imaging (Energy Dispersive X-ray)
  • EBSD Imaging (Electron Backscatter Diffraction)
  • STEM Imaging (Scanning Transmission Electron Microscopy)
  • Zeiss SmartSEM Imaging Software
  • Oxford INCA & Aztec EDX Analysis Software
  •  Located at the Westville campus unit

Zeiss LSM 710 Confocal Laser Scanning Microscope

  • Bright Field Imaging
  • Fluorescence Imaging
  • Differential Interference
  • Contrast (DIC) Imaging
  • Dynamic Cell Migration Imaging
  • Live Cell Imaging
  • Z-Stack Imaging
  • Image Analysis
  • Zeiss Camera
  • Zeiss Zen Imaging Software
  • Located at the Pietermaritzburg campus unit

JEOL 1400 Transmission Electron Microscope (TEM)

  • Bright Field Imaging
  • Diffraction Imaging
  • EDX Imaging (Energy Dispersive X-ray)
  • GATAN Imaging Software
  • Oxford INCA EDX Analysis Software
  • Located at the Pietermaritzburg campus unit

Zeiss EVO LS 15 Variable Pressure Scanning Electron Microscope (VP SEM)

  • Bright Field Imaging
  • Backscattered Electron Imaging
  • VP SEM Imaging (Variable Pressure  SEM)
  • ESEM Imaging (Environmental SEM)
  • EDX Imaging (Energy Dispersive X-ray)
  • Zeiss SmartSEM Imaging Software
  • Oxford INCA EDX Analysis Software
  • Located at the Pietermaritzburg campus unit

JEOL 1010 Transmission Electron Microscope (TEM)

  • Bright Field Imaging
  • Diffraction Imaging
  • iTEM Imaging Software
  • Located at the Westville campus unit

Zeiss LEO 1450 Scanning Electron Microscope (SEM)

  • Bright Field Imaging
  • Backscattered Electron Imaging
  • Zeiss SmartSEM Imaging Software
  • Located at the Westville campus unit

Zeiss Axio Scope A1 Phase Contrast Light Microscope

  • Phase Contrast Imaging
  • Z-Stack Imaging
  • Image Analysis
  • Zeiss Axiocam 105 Camera
  • Zeiss Zen Imaging Software
  • Located at the Pietermaritzburg campus unit

Nikon Eclipse 80i Compound Light Microscope

  • Bright Field Imaging 
  • Fluorescence Imaging
  • Phase Contrast Imaging
  • Polarized Light Imaging
  • Z-Stack Imaging
  • Image Analysis
  • Nikon DS Fi1 Camera
  • NIS Elements D Imaging Software
  • Located at the Westville campus unit

Olympus AX70 Compound Light Microscope

  • Bright Field Imaging
  • Fluorescence Imaging
  • Z-Stack Imaging
  • Image Analysis
  • Nikon DS Fi1 Camera
  • NIS Elements D Imaging Software
  • Located at the Pietermaritzburg campus unit

Nikon AZ100 Stereo Light Microscope

  • Incident Bright Field Imaging
  • Transmitted Bright Field Imaging
  • Z-Stack Imaging
  • Image Analysis
  • Nikon DS Fi3 Camera
  • NIS Elements D Imaging Software
  • Located at the Westville campus unit

Leica MZ16 Stereo Light Microscope

  • Incident Bright Field Imaging
  • Z-Stack Imaging
  • Image Analysis
  • Leica 450FC Camera
  • Leica LAS Imaging Software
  • Located at the Pietermaritzburg campus unit